Journal Paper

• Tongzhi Niu, Zhiyu Xie, Jie Zhang, Lixin Tang, Bin Li, and Hao Wang. “A generalized well neural network for surface defect segmentation in Optical Communication Devices via Template-Testing comparison.” Computers in Industry 151 (2023): 103978.
• Tongzhi Niu, Bin Li, Weifeng Li, Yuanhong Qiu, and Shuanlong Niu. “Positive-sample-based surface defect detection using memory-augmented adversarial autoencoders.” IEEE/ASME Transactions on Mechatronics 27, no. 1 (2021): 46-57.
• Tongzhi Niu, Zhenrong Wang, Weifeng Li, Kai Li, Yuwei Li, Guiyin Xu, and Bin Li. “Learning trustworthy model from noisy labels based on rough set for surface defect detection.” Applied Soft Computing (2024): 112138.
• Tongzhi Niu, Biao Chen, Qianhang Lyu, Bei Li, Wei Luo, Zhenrong Wang, and Bin Li. “Scoring Bayesian Neural Networks for learning from inconsistent labels in surface defect segmentation.” Measurement 225 (2024): 113998.
• Biao Chen, Tongzhi Niu(Corresponding author), Ruoqi Zhang, Hang Zhang, Yuchen Lin, Bin Li. “Feature matching driven background generalization neural networks for surface defect segmentation.” Knowledge-Based Systems 287 (2024):111451.
• Wenqian Qi, Chun-Hsien Chen, Tongzhi Niu(Corresponding author), Shuhui Lyu, Shouqian Sun. “A multisensory Interaction Framework for Human-Cyber–Physical System based on Graph Convolutional Networks.” Advanced Engineering Informatics 61 (2024):102482.
• Chen Biao, Tongzhi Niu(Co-first author), Wenyong Yu, Ruoqi Zhang, Zhenrong Wang, and Bin Li. “A-Net: An A-shape Lightweight Neural Network for Real-time Surface Defect Segmentation.” IEEE Transactions on Instrumentation and Measurement (2023).

• Luo Wei, Tongzhi Niu(Co-first author), Haiming Yao, Lixin Tang, Wenyong Yu, and Bin Li. “Unsupervised Defect Segmentation Via Forgetting-Inputting-Based Feature Fusion and Multiple Hierarchical Feature Difference.” IEEE Sensors Journal (2023).

  
  

Conference Paper

• Tongzhi Niu, Biao Chen, Zhenrong Wang, Ruoqi Zhang, and Bin Li. “Background-Adaptive Surface Defect Detection Neural Networks via Positive Samples.” In IECON 2023-49th Annual Conference of the IEEE Industrial Electronics Society, pp. 01-09. IEEE, 2023. (Session chair)

  
  

Working Manuscript

• Tongzhi Niu, Biao Chen, Lixin Tang, and Bin Li. “Positive-sample-based Domain Generalization Neural Networks for Surface Defect Segmentation.”